Resonant X-Ray Scattering in Correlated Systems

• Corporate Author: SpringerLink (Online service)
• Other Authors: Murakami, Youichi (Editor), Ishihara, Sumio (Editor)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2017.
• Series: Springer Tracts in Modern Physics, 269
• Subjects: Physics.; Condensed matter.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials science.; Condensed Matter Physics.; Characterization and Evaluation of Materials.; Spectroscopy and Microscopy.; Nanotechnology and Microengineering.
• Physical Description: VII, 241 p. 151 illus., 25 illus. in color. online resource.
• ISBN: 9783662532270
• ISSN: 0081-3869 ;

The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.