Resonant X-Ray Scattering in Correlated Systems

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Murakami, Youichi (Επιμελητής έκδοσης), Ishihara, Sumio (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2017.
• Σειρά: Springer Tracts in Modern Physics, 269
• Θέματα: Physics.; Condensed matter.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials science.; Condensed Matter Physics.; Characterization and Evaluation of Materials.; Spectroscopy and Microscopy.; Nanotechnology and Microengineering.

The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of...