Resonant X-Ray Scattering in Correlated Systems

• Corporate Author: SpringerLink (Online service)
• Other Authors: Murakami, Youichi (Editor), Ishihara, Sumio (Editor)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2017.
• Series: Springer Tracts in Modern Physics, 269
• Subjects: Physics.; Condensed matter.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials science.; Condensed Matter Physics.; Characterization and Evaluation of Materials.; Spectroscopy and Microscopy.; Nanotechnology and Microengineering.

The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of...

Table of Contents:

• Resonant X-ray Scattering and Orbital Degree of Freedom in Correlated Electron Systems (S. Ishihara)
• Resonant X-ray scattering in 3d electron systems (H. Nakao)
• Observation of multipole orderings in f-electron systems by resonant x-ray diffraction (T. Matsumura)
• Hard X-ray Resonant Scattering for Studying Magnetism (T. Arima)
• Resonant soft x-ray scattering studies of transition-metal oxides (H. Wadati)
• Resonant inelastic x-ray scattering in strongly correlated copper oxides (K. Ishii).