Magnetic Resonance of Semiconductors and Their Nanostructures Basic and Advanced Applications /

• Κύριοι συγγραφείς: Baranov, Pavel G. (Συγγραφέας), von Bardeleben, Hans Jürgen (Συγγραφέας), Jelezko, Fedor (Συγγραφέας), Wrachtrup, Jörg (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Vienna : Springer Vienna : Imprint: Springer, 2017.
• Σειρά: Springer Series in Materials Science, 253
• Θέματα: Physics.; Spectroscopy.; Magnetism.; Magnetic materials.; Semiconductors.; Nanotechnology.; Materials science.; Spectroscopy/Spectrometry.; Characterization and Evaluation of Materials.; Magnetism, Magnetic Materials.; Applied and Technical Physics.

This book explains different magnetic resonance (MR) techniques and uses different combinations of these techniques to analyze defects in semiconductors and nanostructures. It also introduces novelties such as single defects MR and electron-paramagnetic-resonance-based methods: electron spin echo, e...

Πίνακας περιεχομένων:

• Preface
• Basic Concepts of Electron Paramagnetic Resonance (EPR)
• Fundamentals of EPR Related Methods
• Magnetic Resonance Studies of Intrinsic Defects in Semiconductors
• State-of-Art: High-Frequency EPR, ESE, ENDOR and ODMR in Wide-Band-Gap Semiconductors
• Magnetic Resonance in Semiconductor Micro- and Nanostructures
• Perspectives of Applications of Magnetic Properties of Semiconductor Nanostructures and Single Defects.