Defects and Impurities in Silicon Materials An Introduction to Atomic-Level Silicon Engineering /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Yoshida, Yutaka (Επιμελητής έκδοσης), Langouche, Guido (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Tokyo : Springer Japan : Imprint: Springer, 2015.
• Σειρά: Lecture Notes in Physics, 916
• Θέματα: Physics.; Solid state physics.; Nanoscale science.; Nanoscience.; Nanostructures.; Semiconductors.; Nanotechnology.; Engineering > Materials.; Materials Engineering.; Nanotechnology and Microengineering.; Solid State Physics.; Nanoscale Science and Technology.
• Φυσική περιγραφή: XV, 487 p. 292 illus., 180 illus. in color. online resource.
• ISBN: 9784431558002
• ISSN: 0075-8450 ;

This book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the dynamic behaviors in silicon materials, which have become more directly accessible over the past 20 years. Such progress has been made possible by newly developed experimental methods, first principle theories, and computer simulation techniques. The book is aimed at young researchers, scientists, and technicians in related industries. The main purposes are to provide readers with 1) the basic physics behind defects in silicon materials, 2) the atomistic modeling as well as the characterization techniques related to defects and impurities in silicon materials, and 3) an overview of the wide range of the research fields involved.