Test Pattern Generation using Boolean Proof Engines

• Κύριοι συγγραφείς: Drechsler, Rolf (Συγγραφέας), Eggersglüβ, Stephan (Συγγραφέας), Fey, Görschwin (Συγγραφέας), Tille, Daniel (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Dordrecht : Springer Netherlands, 2009.
• Θέματα: Engineering.; Electronics.; Microelectronics.; Electronic circuits.; Circuits and Systems.; Electronics and Microelectronics, Instrumentation.

After producing a chip, the functional correctness of the integrated circuit has to be checked. Otherwise products with malfunctions would be delivered to customers, which is not acceptable for any company. Many algorithms for "Automatic Test Pattern Generation" (ATPG) have been proposed i...