Test Pattern Generation using Boolean Proof Engines

• Main Authors: Drechsler, Rolf (Author), Eggersglüβ, Stephan (Author), Fey, Görschwin (Author), Tille, Daniel (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Dordrecht : Springer Netherlands, 2009.
• Subjects: Engineering.; Electronics.; Microelectronics.; Electronic circuits.; Circuits and Systems.; Electronics and Microelectronics, Instrumentation.

After producing a chip, the functional correctness of the integrated circuit has to be checked. Otherwise products with malfunctions would be delivered to customers, which is not acceptable for any company. Many algorithms for "Automatic Test Pattern Generation" (ATPG) have been proposed i...

Table of Contents:

• Preliminaries
• Boolean Satisfiability
• SAT-Based ATPG
• Learning Techniques
• Multiple-Valued Logic
• Improved Circuit-to-CNF Conversion
• Branching Strategies
• Integration into Industrial Flow
• Delay Faults
• Summary and Outlook.