Test Pattern Generation using Boolean Proof Engines

Test Pattern Generation using Boolean Proof Engines

After producing a chip, the functional correctness of the integrated circuit has to be checked. Otherwise products with malfunctions would be delivered to customers, which is not acceptable for any company. Many algorithms for "Automatic Test Pattern Generation" (ATPG) have been proposed i...

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Bibliographic Details
Main Authors: Drechsler, Rolf (Author), Eggersglüβ, Stephan (Author), Fey, Görschwin (Author), Tille, Daniel (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: Dordrecht : Springer Netherlands, 2009.
Subjects:
Engineering.
Electronics.
Microelectronics.
Electronic circuits.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
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ΒΚΠ - Πατρα: ALFd

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Call Number: 330.01 BAU
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ΒΚΠ - Πατρα: BSC

Holdings details from ΒΚΠ - Πατρα: BSC
Call Number: 330.01 BAU
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