Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the c...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Singhee, Amith (Συγγραφέας), Rutenbar, Rob A. (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Μορφή:	Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:	English
Έκδοση:	Dordrecht : Springer Netherlands, 2009.
Σειρά:	Lecture Notes in Electrical Engineering, 46
Θέματα:	Engineering. Computer system failures. Data structures (Computer science). Electronic circuits. Circuits and Systems. Data Structures. System Performance and Evaluation.
Διαθέσιμο Online:	Full Text via HEAL-Link

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