Robust Computing with Nano-scale Devices Progresses and Challenges /

Although complementary metal-oxide semiconductor (CMOS) technology will continue dominating the digital electronic circuits for the next 10-15 years, a number of grand challenges have emerged as the transistor size scales down. The rising costs of semiconductor mask and fabrication pose economic bar...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Άλλοι συγγραφείς: Huang, Chao (Επιμελητής έκδοσης)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Dordrecht : Springer Netherlands : Imprint: Springer, 2010.
Σειρά:Lecture Notes in Electrical Engineering, 58
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Πίνακας περιεχομένων:
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  • Transistor-Level Based Defect-Tolerance for Reliable Nanoelectronics
  • Fault-Tolerant Design for Nanowire-Based Programmable Logic Arrays
  • Built-In Self-Test and Defect Tolerance for Molecular Electronics-Based NanoFabrics
  • The Prospect and Challenges of CNFET Based Circuits: A Physical Insight
  • Computing with Nanowires: A Self Assembled Neuromorphic Architecture
  • Computational Opportunities and CAD for Nanotechnologies.