Emerging Technologies and Circuits

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Amara, Amara (Επιμελητής έκδοσης), Ea, Thomas (Επιμελητής έκδοσης), Belleville, Marc (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Dordrecht : Springer Netherlands : Imprint: Springer, 2010.
• Σειρά: Lecture Notes in Electrical Engineering, 66
• Θέματα: Engineering.; Computer memory systems.; Electronic circuits.; Nanotechnology.; Circuits and Systems.; Memory Structures.

With the semiconductor market growth, new Integrated Circuit designs are pushing the limit of the technology and in some cases, require specific fine-tuning of certain process modules in manufacturing. Thus the communities of design and technology are increasingly intertwined. The issues that requir...

Πίνακας περιεχομένων:

• Synergy Between Design and Technology: A Key Factor in the Evolving Microelectronic Landscape
• EMERGING TECHNOLOGY AND DEVICES
• New State Variable Opportunities Beyond CMOS: A System Perspective
• A Simple Compact Model to Analyze the Impact of Ballistic and Quasi-Ballistic Transport on Ring Oscillator Performance
• ADVANCED DEVICES AND CIRUITS
• Low-Voltage Scaled 6T FinFET SRAM Cells
• Independent-Double-Gate FINFET SRAM Cell for Drastic Leakage Current Reduction
• Metal Gate Effects on a 32 nm Metal Gate Resistor
• RELIABILITY AND SEU
• Threshold Voltage Shift Instability Induced by Plasma Charging Damage in MOSFETS with High-K Dielectric
• Analysis of SI Substrate Damage Induced by Inductively Coupled Plasma Reactor with Various Superposed Bias Frequencies
• POWER, TIMING AND VARIABILITY
• CMOS SOI Technology for WPAN: Application to 60 GHZ LNA
• SRAM Memory Cell Leakage Reduction Design Techniques in 65 nm Low Power PD-SOI CMOS
• Resilient Circuits for Dynamic Variation Tolerance
• Process Variability-Induced Timing Failures – A Challenge in Nanometer CMOS Low-Power Design
• How Does Inverse Temperature Dependence Affect Timing Sign-Off
• CMOS Logic Gates Leakage Modeling Under Statistical Process Variations
• On-Chip Circuit Technique for Measuring Jitter and Skew with Picosecond Resolution
• ANALOG AND MIXED SIGNAL
• DC–DC Converter Technologies for On-Chip Distributed Power Supply Systems – 3D Stacking and Hybrid Operation
• Sampled Analog Signal Processing: From Software-Defined to Software Radio.