Accelerating Test, Validation and Debug of High Speed Serial Interfaces

Accelerating Test, Validation and Debug of High Speed Serial Interfaces

High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive in...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Fan, Yongquan (Συγγραφέας), Zilic, Zeljko (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Μορφή:	Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:	English
Έκδοση:	Dordrecht : Springer Netherlands, 2011.
Θέματα:	Engineering. Computer system failures. Software engineering. Electronics. Microelectronics. Electronic circuits. Circuits and Systems. Software Engineering/Programming and Operating Systems. Electronics and Microelectronics, Instrumentation. System Performance and Evaluation.
Διαθέσιμο Online:	Full Text via HEAL-Link

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