Accelerating Test, Validation and Debug of High Speed Serial Interfaces

• Κύριοι συγγραφείς: Fan, Yongquan (Συγγραφέας), Zilic, Zeljko (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Dordrecht : Springer Netherlands, 2011.
• Θέματα: Engineering.; Computer system failures.; Software engineering.; Electronics.; Microelectronics.; Electronic circuits.; Circuits and Systems.; Software Engineering/Programming and Operating Systems.; Electronics and Microelectronics, Instrumentation.; System Performance and Evaluation.

High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive in...