APA (7th ed.) Citation

Krishnaswamy, S., Markov, I. L., & Hayes, J. P. (2013). Design, Analysis and Test of Logic Circuits Under Uncertainty. Springer Netherlands : Imprint: Springer.

Chicago Style (17th ed.) Citation

Krishnaswamy, Smita, Igor L. Markov, and John P. Hayes. Design, Analysis and Test of Logic Circuits Under Uncertainty. Dordrecht: Springer Netherlands : Imprint: Springer, 2013.

MLA (8th ed.) Citation

Krishnaswamy, Smita, et al. Design, Analysis and Test of Logic Circuits Under Uncertainty. Springer Netherlands : Imprint: Springer, 2013.