Design, Analysis and Test of Logic Circuits Under Uncertainty

• Main Authors: Krishnaswamy, Smita (Author), Markov, Igor L. (Author), Hayes, John P. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2013.
• Series: Lecture Notes in Electrical Engineering, 115
• Subjects: Engineering.; Computer hardware.; Arithmetic and logic units, Computer.; Logic design.; Computer software > Reusability.; Computer science > Mathematics.; Electronic circuits.; Circuits and Systems.; Arithmetic and Logic Structures.; Computer Hardware.; Performance and Reliability.; Logic Design.; Symbolic and Algebraic Manipulation.

Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits.  To improve future semiconductor designs,...