Design, Analysis and Test of Logic Circuits Under Uncertainty

• Κύριοι συγγραφείς: Krishnaswamy, Smita (Συγγραφέας), Markov, Igor L. (Συγγραφέας), Hayes, John P. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Dordrecht : Springer Netherlands : Imprint: Springer, 2013.
• Σειρά: Lecture Notes in Electrical Engineering, 115
• Θέματα: Engineering.; Computer hardware.; Arithmetic and logic units, Computer.; Logic design.; Computer software > Reusability.; Computer science > Mathematics.; Electronic circuits.; Circuits and Systems.; Arithmetic and Logic Structures.; Computer Hardware.; Performance and Reliability.; Logic Design.; Symbolic and Algebraic Manipulation.

Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits.  To improve future semiconductor designs,...

Πίνακας περιεχομένων:

• Introduction
• Probabilistic Transfer Matrices
• Computing with Probabilistic Transfer Matrices
• Testing Logic Circuits for Probabilistic Faults
• Signtaure-based Reliability Analysis
• Design for Robustness
• Summary and Extensions.