APA (7th ed.) Citation

Im, S., Chang, Y., & Kim, J. H. (2013). Photo-Excited Charge Collection Spectroscopy: Probing the traps in field-effect transistors. Springer Netherlands : Imprint: Springer.

Chicago Style (17th ed.) Citation

Im, Seongil, Youn-Gyoung Chang, and Jae Hoon Kim. Photo-Excited Charge Collection Spectroscopy: Probing the Traps in Field-effect Transistors. Dordrecht: Springer Netherlands : Imprint: Springer, 2013.

MLA (8th ed.) Citation

Im, Seongil, et al. Photo-Excited Charge Collection Spectroscopy: Probing the Traps in Field-effect Transistors. Springer Netherlands : Imprint: Springer, 2013.