Παραπομπή σε μορφή APA (7η εκδ.)

Im, S., Chang, Y., & Kim, J. H. (2013). Photo-Excited Charge Collection Spectroscopy: Probing the traps in field-effect transistors. Springer Netherlands : Imprint: Springer.

Παραπομπή σε μορφή Chicago (17η εκδ.)

Im, Seongil, Youn-Gyoung Chang, και Jae Hoon Kim. Photo-Excited Charge Collection Spectroscopy: Probing the Traps in Field-effect Transistors. Dordrecht: Springer Netherlands : Imprint: Springer, 2013.

Παραπομπή σε μορφή MLA (8th εκδ.)

Im, Seongil, et al. Photo-Excited Charge Collection Spectroscopy: Probing the Traps in Field-effect Transistors. Springer Netherlands : Imprint: Springer, 2013.