Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors /

• Κύριοι συγγραφείς: Im, Seongil (Συγγραφέας), Chang, Youn-Gyoung (Συγγραφέας), Kim, Jae Hoon (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Dordrecht : Springer Netherlands : Imprint: Springer, 2013.
• Σειρά: SpringerBriefs in Physics,
• Θέματα: Physics.; Solid state physics.; Electronic circuits.; Physical measurements.; Measurement.; Optics.; Optoelectronics.; Plasmons (Physics).; Electronic Circuits and Devices.; Solid State Physics.; Circuits and Systems.; Optics, Optoelectronics, Plasmonics and Optical Devices.; Measurement Science and Instrumentation.

Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly depending on the nature and density of charge traps pres...

Πίνακας περιεχομένων:

• Chapter 1 Device Stability and Photo-Excited Charge-Collection Spectroscopy
• Chapter 2 Instrumentations for PECCS
• Chapter 3 PECCS measurements in Organic FETs
• Chapter 4 PECCS measurements in Oxide FETs
• Chapter 5 PECCS measurements in Nanostructure FETs
• Chapter 6 Summary and limiting factors of PECCS.