Analytical Transmission Electron Microscopy An Introduction for Operators /

• Κύριοι συγγραφείς: Thomas, Jürgen (Συγγραφέας), Gemming, Thomas (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Dordrecht : Springer Netherlands : Imprint: Springer, 2014.
• Θέματα: Materials science.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials Science.; Characterization and Evaluation of Materials.; Spectroscopy and Microscopy.; Spectroscopy/Spectrometry.; Nanotechnology and Microengineering.

This work is based on experiences acquired by the authors regarding often asked questions and problems during manifold education of beginners in analytical transmission electron microscopy. These experiences are summarised illustratively in this textbook. Explanations based on simple models and hint...

Πίνακας περιεχομένων:

• From the Contents: Why this effort?
• What should we know about electron optics and the construction of an electron microscope
• We prepare electron-transparent samples
• Let us start with the work
• Let us switch to electron diffraction
• Why do we see any contrasts in the images?
• We increase the magnification
• Let us switch to scanning transmission electron microscopy
• Let us use the analytical possibilities
• Basics explained in more detail (a little bit more mathematics).