High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip

This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliabilit...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Wang, Zheng (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Chattopadhyay, Anupam (http://id.loc.gov/vocabulary/relators/aut)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2018.
Έκδοση:1st ed. 2018.
Σειρά:Computer Architecture and Design Methodologies,
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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245 1 0 |a High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip  |h [electronic resource] /  |c by Zheng Wang, Anupam Chattopadhyay. 
250 |a 1st ed. 2018. 
264 1 |a Singapore :  |b Springer Singapore :  |b Imprint: Springer,  |c 2018. 
300 |a XX, 197 p. 104 illus., 72 illus. in color.  |b online resource. 
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490 1 |a Computer Architecture and Design Methodologies,  |x 2367-3478 
505 0 |a Introduction -- Background -- Related Work -- High-level Fault Injection and Simulation -- Architectural Reliability Estimation -- Architectural Reliability Exploration -- System-level Reliability Exploration -- Conclusion and Outlook. 
520 |a This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures. . 
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650 2 4 |a Electronic Circuits and Devices.  |0 http://scigraph.springernature.com/things/product-market-codes/P31010 
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