EM Wave Propagation Analysis in Plasma Covered Radar Absorbing Material

This book focuses on EM propagation characteristics within multilayered plasma-dielectric-metallic media. The method used for analysis is impedance transformation method. Plasma covered radar absorbing material is approximated as a multi-layered dielectric medium. The plasma is considered to be boun...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Singh, Hema (Συγγραφέας), Antony, Simy (Συγγραφέας), Rawat, Harish Singh (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2017.
Σειρά:SpringerBriefs in Electrical and Computer Engineering,
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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100 1 |a Singh, Hema.  |e author. 
245 1 0 |a EM Wave Propagation Analysis in Plasma Covered Radar Absorbing Material  |h [electronic resource] /  |c by Hema Singh, Simy Antony, Harish Singh Rawat. 
264 1 |a Singapore :  |b Springer Singapore :  |b Imprint: Springer,  |c 2017. 
300 |a XXI, 43 p. 36 illus., 27 illus. in color.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
490 1 |a SpringerBriefs in Electrical and Computer Engineering,  |x 2191-8112 
505 0 |a Introduction -- Role of Plasma Parameters -- Formulation for EM Propagation in Plasma covered RAM -- Results and Discussion -- Conclusion -- References -- Subject Index. 
520 |a This book focuses on EM propagation characteristics within multilayered plasma-dielectric-metallic media. The method used for analysis is impedance transformation method. Plasma covered radar absorbing material is approximated as a multi-layered dielectric medium. The plasma is considered to be bounded homogeneous/inhomogeneous medium. The reflection coefficient and hence return loss is analytically derived. The role of plasma parameters, such as electron density, collision frequency, plasma thickness, and plasma density profile in the absorption behavior of multi-layered plasma-RAM structure is described. This book provides a clearer picture of EM propagation within plasma. The reader will get an insight of plasma parameters that play significant role in deciding the absorption characteristics of plasma covered surfaces. 
650 0 |a Engineering. 
650 0 |a Microwaves. 
650 0 |a Optical engineering. 
650 0 |a Electronics. 
650 0 |a Microelectronics. 
650 1 4 |a Engineering. 
650 2 4 |a Microwaves, RF and Optical Engineering. 
650 2 4 |a Classical Electrodynamics. 
650 2 4 |a Electronics and Microelectronics, Instrumentation. 
700 1 |a Antony, Simy.  |e author. 
700 1 |a Rawat, Harish Singh.  |e author. 
710 2 |a SpringerLink (Online service) 
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776 0 8 |i Printed edition:  |z 9789811022685 
830 0 |a SpringerBriefs in Electrical and Computer Engineering,  |x 2191-8112 
856 4 0 |u http://dx.doi.org/10.1007/978-981-10-2269-2  |z Full Text via HEAL-Link 
912 |a ZDB-2-ENG 
950 |a Engineering (Springer-11647)