3D TCAD Simulation for CMOS Nanoeletronic Devices

This book demonstrates how to use the Synopsys Sentaurus TCAD 2014 version for the design and simulation of 3D CMOS (complementary metal-oxide-semiconductor) semiconductor nanoelectronic devices, while also providing selected source codes (Technology Computer-Aided Design, TCAD). Instead of the buil...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Wu, Yung-Chun (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Jhan, Yi-Ruei (http://id.loc.gov/vocabulary/relators/aut)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2018.
Έκδοση:1st ed. 2018.
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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100 1 |a Wu, Yung-Chun.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
245 1 0 |a 3D TCAD Simulation for CMOS Nanoeletronic Devices  |h [electronic resource] /  |c by Yung-Chun Wu, Yi-Ruei Jhan. 
250 |a 1st ed. 2018. 
264 1 |a Singapore :  |b Springer Singapore :  |b Imprint: Springer,  |c 2018. 
300 |a XIII, 330 p. 243 illus., 240 illus. in color.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
505 0 |a Introduction of Synopsys Sentaurus TCAD 2014 version software environment operation interface and tools -- Simulation analysis of 2D MOSFET -- Simulation analysis of 3D FinFET with LG = 15 nm -- Simulation analysis of Inverter and SRAM of 3D FinFET with LG = 15 nm -- Simulation analysis of GAA NWFET -- Simulation analysis of Junctionless FET with LG = 10 nm -- Simulation analysis of Tunnel FET -- Simulation analysis of Si and Ge 3D FinFET with LG = 3 nm. 
520 |a This book demonstrates how to use the Synopsys Sentaurus TCAD 2014 version for the design and simulation of 3D CMOS (complementary metal-oxide-semiconductor) semiconductor nanoelectronic devices, while also providing selected source codes (Technology Computer-Aided Design, TCAD). Instead of the built-in examples of Sentaurus TCAD 2014, the practical cases presented here, based on years of teaching and research experience, are used to interpret and analyze simulation results of the physical and electrical properties of designed 3D CMOSFET (metal-oxide-semiconductor field-effect transistor) nanoelectronic devices. The book also addresses in detail the fundamental theory of advanced semiconductor device design for the further simulation and analysis of electric and physical properties of semiconductor devices. The design and simulation technologies for nano-semiconductor devices explored here are more practical in nature and representative of the semiconductor industry, and as such can promote the development of pioneering semiconductor devices, semiconductor device physics, and more practically-oriented approaches to teaching and learning semiconductor engineering. The book can be used for graduate and senior undergraduate students alike, while also offering a reference guide for engineers and experts in the semiconductor industry. Readers are expected to have some preliminary knowledge of the field. 
650 0 |a Electronics. 
650 0 |a Microelectronics. 
650 0 |a Semiconductors. 
650 0 |a Nanotechnology. 
650 0 |a Industrial engineering. 
650 0 |a Production engineering. 
650 1 4 |a Electronics and Microelectronics, Instrumentation.  |0 http://scigraph.springernature.com/things/product-market-codes/T24027 
650 2 4 |a Semiconductors.  |0 http://scigraph.springernature.com/things/product-market-codes/P25150 
650 2 4 |a Nanotechnology and Microengineering.  |0 http://scigraph.springernature.com/things/product-market-codes/T18000 
650 2 4 |a Industrial and Production Engineering.  |0 http://scigraph.springernature.com/things/product-market-codes/T22008 
700 1 |a Jhan, Yi-Ruei.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
776 0 8 |i Printed edition:  |z 9789811030659 
776 0 8 |i Printed edition:  |z 9789811030673 
776 0 8 |i Printed edition:  |z 9789811097799 
856 4 0 |u https://doi.org/10.1007/978-981-10-3066-6  |z Full Text via HEAL-Link 
912 |a ZDB-2-ENG 
950 |a Engineering (Springer-11647)