Brodusch, N., Demers, H., & Gauvin, R. (2018). Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (1st ed. 2018.). Springer Singapore : Imprint: Springer. https://doi.org/10.1007/978-981-10-4433-5
Παραπομπή σε μορφή Chicago (17η εκδ.)Brodusch, Nicolas, Hendrix Demers, και Raynald Gauvin. Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization. 1st ed. 2018. Singapore: Springer Singapore : Imprint: Springer, 2018. https://doi.org/10.1007/978-981-10-4433-5.
Παραπομπή σε μορφή MLA (8th εκδ.)Brodusch, Nicolas, et al. Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization. 1st ed. 2018. Springer Singapore : Imprint: Springer, 2018. https://doi.org/10.1007/978-981-10-4433-5.
