Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization /

• Κύριοι συγγραφείς: Brodusch, Nicolas (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Demers, Hendrix (http://id.loc.gov/vocabulary/relators/aut), Gauvin, Raynald (http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2018.
• Έκδοση: 1st ed. 2018.
• Σειρά: SpringerBriefs in Applied Sciences and Technology,
• Θέματα: Materials science.; Spectroscopy.; Microscopy.; Nanotechnology.; Characterization and Evaluation of Materials.; Spectroscopy and Microscopy.; Nanotechnology and Microengineering.
• Φυσική περιγραφή: XII, 137 p. 53 illus., 20 illus. in color. online resource.
• ISBN: 9789811044335
• ISSN: 2191-530X
• DOI: 10.1007/978-981-10-4433-5

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage.