Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization /

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron mi...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Brodusch, Nicolas (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Demers, Hendrix (http://id.loc.gov/vocabulary/relators/aut), Gauvin, Raynald (http://id.loc.gov/vocabulary/relators/aut)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2018.
Έκδοση:1st ed. 2018.
Σειρά:SpringerBriefs in Applied Sciences and Technology,
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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245 1 0 |a Field Emission Scanning Electron Microscopy  |h [electronic resource] :  |b New Perspectives for Materials Characterization /  |c by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin. 
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520 |a This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage. 
650 0 |a Materials science. 
650 0 |a Spectroscopy. 
650 0 |a Microscopy. 
650 0 |a Nanotechnology. 
650 1 4 |a Characterization and Evaluation of Materials.  |0 http://scigraph.springernature.com/things/product-market-codes/Z17000 
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650 2 4 |a Nanotechnology and Microengineering.  |0 http://scigraph.springernature.com/things/product-market-codes/T18000 
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700 1 |a Gauvin, Raynald.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
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