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03034nam a2200517 4500 |
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978-981-10-4433-5 |
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DE-He213 |
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20191027072024.0 |
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cr nn 008mamaa |
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170927s2018 si | s |||| 0|eng d |
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|a 9789811044335
|9 978-981-10-4433-5
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|a 10.1007/978-981-10-4433-5
|2 doi
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|a 620.11
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|a Brodusch, Nicolas.
|e author.
|4 aut
|4 http://id.loc.gov/vocabulary/relators/aut
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|a Field Emission Scanning Electron Microscopy
|h [electronic resource] :
|b New Perspectives for Materials Characterization /
|c by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin.
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| 250 |
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|a 1st ed. 2018.
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| 264 |
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1 |
|a Singapore :
|b Springer Singapore :
|b Imprint: Springer,
|c 2018.
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| 300 |
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|a XII, 137 p. 53 illus., 20 illus. in color.
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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| 347 |
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|a text file
|b PDF
|2 rda
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| 490 |
1 |
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|a SpringerBriefs in Applied Sciences and Technology,
|x 2191-530X
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| 520 |
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|a This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage.
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| 650 |
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|a Materials science.
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| 650 |
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|a Spectroscopy.
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| 650 |
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|a Microscopy.
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| 650 |
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|a Nanotechnology.
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| 650 |
1 |
4 |
|a Characterization and Evaluation of Materials.
|0 http://scigraph.springernature.com/things/product-market-codes/Z17000
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| 650 |
2 |
4 |
|a Spectroscopy and Microscopy.
|0 http://scigraph.springernature.com/things/product-market-codes/P31090
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| 650 |
2 |
4 |
|a Nanotechnology and Microengineering.
|0 http://scigraph.springernature.com/things/product-market-codes/T18000
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| 700 |
1 |
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|a Demers, Hendrix.
|e author.
|4 aut
|4 http://id.loc.gov/vocabulary/relators/aut
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| 700 |
1 |
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|a Gauvin, Raynald.
|e author.
|4 aut
|4 http://id.loc.gov/vocabulary/relators/aut
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| 710 |
2 |
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|a SpringerLink (Online service)
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| 773 |
0 |
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|t Springer eBooks
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| 776 |
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8 |
|i Printed edition:
|z 9789811044328
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| 776 |
0 |
8 |
|i Printed edition:
|z 9789811044342
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| 830 |
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|a SpringerBriefs in Applied Sciences and Technology,
|x 2191-530X
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| 856 |
4 |
0 |
|u https://doi.org/10.1007/978-981-10-4433-5
|z Full Text via HEAL-Link
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| 912 |
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|a ZDB-2-CMS
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| 950 |
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|a Chemistry and Materials Science (Springer-11644)
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