Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization /

• Κύριοι συγγραφείς: Brodusch, Nicolas (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Demers, Hendrix (http://id.loc.gov/vocabulary/relators/aut), Gauvin, Raynald (http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2018.
• Έκδοση: 1st ed. 2018.
• Σειρά: SpringerBriefs in Applied Sciences and Technology,
• Θέματα: Materials science.; Spectroscopy.; Microscopy.; Nanotechnology.; Characterization and Evaluation of Materials.; Spectroscopy and Microscopy.; Nanotechnology and Microengineering.

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron mi...