EM Material Characterization Techniques for Metamaterials

• Κύριοι συγγραφείς: Nair, Raveendranath U. (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Dutta, Maumita (http://id.loc.gov/vocabulary/relators/aut), P.S., Mohammed Yazeen (http://id.loc.gov/vocabulary/relators/aut), Venu, K. S. (http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2018.
• Έκδοση: 1st ed. 2018.
• Σειρά: SpringerBriefs in Computational Electromagnetics,
• Θέματα: Microwaves.; Optical engineering.; Optical materials.; Electronic materials.; Electrical engineering.; Microwaves, RF and Optical Engineering.; Optical and Electronic Materials.; Communications Engineering, Networks.
• Φυσική περιγραφή: XXIII, 50 p. 18 illus., 12 illus. in color. online resource.
• ISBN: 9789811065170
• ISSN: 2365-6239
• DOI: 10.1007/978-981-10-6517-0

This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials  .