Residual Stresses and Nanoindentation Testing of Films and Coatings

• Κύριοι συγγραφείς: Wang, Haidou (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Zhu, Lina (http://id.loc.gov/vocabulary/relators/aut), Xu, Binshi (http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2018.
• Έκδοση: 1st ed. 2018.
• Θέματα: Materials science.; Mechanics.; Mechanics, Applied.; Materials-Surfaces.; Thin films.; Nanotechnology.; Characterization and Evaluation of Materials.; Solid Mechanics.; Surfaces and Interfaces, Thin Films.

This book covers the basic principles and application of nanoindentation technology to determine residual stresses in films and coatings. It briefly introduces various detection technologies for measuring residual stresses, while mainly focusing on nanoindentation. Subsequently, nanoindentation is u...

Πίνακας περιεχομένων:

• Residual stresses of materials.- Principle and Methods of Nanoindentation Test.- Theoretical models for measuring residual stress by nanoindentation method.- Application of Suresh and Lee models in the measurement of residual stress of bulk materials
• Application of Suresh and Lee models in the measurement of residual stress of coatings
• Application of Suresh and Lee models in the measurement of residual stress of films.- Application of other models in the measurement of residual stress.