VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Rajaram, S. (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Balamurugan, N.B (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Gracia Nirmala Rani, D. (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Singh, Virendra (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2019.
• Έκδοση: 1st ed. 2019.
• Σειρά: Communications in Computer and Information Science, 892
• Θέματα: Computer hardware.; Computer organization.; Computer Hardware.; Computer Systems Organization and Communication Networks.
• Φυσική περιγραφή: XVIII, 722 p. 711 illus., 324 illus. in color. online resource.
• ISBN: 9789811359507
• ISSN: 1865-0929 ;
• DOI: 10.1007/978-981-13-5950-7

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.