High Definition Metrology Based Surface Quality Control and Applications

• Κύριοι συγγραφείς: Du, Shichang (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Xi, Lifeng (http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2019.
• Έκδοση: 1st ed. 2019.
• Θέματα: Materials-Surfaces.; Thin films.; Quality control.; Reliability.; Industrial safety.; Mechanical engineering.; Manufactures.; Physical measurements.; Measurement .; Surfaces and Interfaces, Thin Films.; Quality Control, Reliability, Safety and Risk.; Mechanical Engineering.; Manufacturing, Machines, Tools, Processes.; Measurement Science and Instrumentation.

 This book provides insights into surface quality control techniques and applications based on high-definition metrology (HDM). Intended as a reference resource for engineers who routinely use a variety of quality control methods and are interested in understanding the data processing, from HDM data to final control actions, it can also be used as a textbook for advanced courses in engineering quality control applications for students who are already familiar with quality control methods and practices. It enables readers to not only assimilate the quality control methods involved, but also to quickly implement the techniques in practical engineering problems. Further, it includes numerous case studies to highlight the implementation of the methods using measured HDM data of surface features. Since MATLAB is extensively employed in these case studies, familiarity with this software is helpful, as is a general understanding of surface quality control methods. 

 Acknowledgement -- Introduction -- High Definition Metrology -- Surface Characterization and Evaluation -- Surface Filtering -- Surface Classification -- Surface Monitoring -- Surface Prediction -- Online Compensation Manufacturing.