High Definition Metrology Based Surface Quality Control and Applications

• Κύριοι συγγραφείς: Du, Shichang (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Xi, Lifeng (http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2019.
• Έκδοση: 1st ed. 2019.
• Θέματα: Materials-Surfaces.; Thin films.; Quality control.; Reliability.; Industrial safety.; Mechanical engineering.; Manufactures.; Physical measurements.; Measurement .; Surfaces and Interfaces, Thin Films.; Quality Control, Reliability, Safety and Risk.; Mechanical Engineering.; Manufacturing, Machines, Tools, Processes.; Measurement Science and Instrumentation.

This book provides insights into surface quality control techniques and applications based on high-definition metrology (HDM). Intended as a reference resource for engineers who routinely use a variety of quality control methods and are interested in understanding the data processing, from HDM data...