Probing Crystal Plasticity at the Nanoscales Synchrotron X-ray Microdiffraction /

• Κύριος συγγραφέας: Budiman, Arief Suriadi (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2015.
• Σειρά: SpringerBriefs in Applied Sciences and Technology,
• Θέματα: Materials science.; Crystallography.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials Science.; Characterization and Evaluation of Materials.; Nanotechnology and Microengineering.; Spectroscopy and Microscopy.

This Brief highlights the search for strain gradients and geometrically necessary dislocations as a possible source of strength for two cases of deformation of materials at small scales: nanoindented single crystal copper and uniaxially compressed single crystal submicron gold pillars. When crystall...

Πίνακας περιεχομένων:

• From the Contents: Introduction
• Synchrotron White-beam X-ray Microdiffraction at the Advanced Light Source, Berkeley Lab
• Electromigration-induced Plasticity in Cu Interconnects: The Length Scale Dependence.