SpringerLink (Online service), Sengupta, A., Dasgupta, S., Singh, V., Sharma, R., & Kumar Vishvakarma, S. (2019). VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers (1st ed. 2019.). Springer Singapore : Imprint: Springer. https://doi.org/10.1007/978-981-32-9767-8
Παραπομπή σε μορφή Chicago (17η εκδ.)SpringerLink (Online service), Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, και Santosh Kumar Vishvakarma. VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers. 1st ed. 2019. Singapore: Springer Singapore : Imprint: Springer, 2019. https://doi.org/10.1007/978-981-32-9767-8.
Παραπομπή σε μορφή MLA (8th εκδ.)SpringerLink (Online service), et al. VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers. 1st ed. 2019. Springer Singapore : Imprint: Springer, 2019. https://doi.org/10.1007/978-981-32-9767-8.
