VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers /

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mix...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Άλλοι συγγραφείς: Sengupta, Anirban (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Dasgupta, Sudeb (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Singh, Virendra (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Sharma, Rohit (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Kumar Vishvakarma, Santosh (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2019.
Έκδοση:1st ed. 2019.
Σειρά:Communications in Computer and Information Science, 1066
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Περιγραφή
Περίληψη:This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
Φυσική περιγραφή:XVI, 775 p. 545 illus., 336 illus. in color. online resource.
ISBN:9789813297678
ISSN:1865-0929 ;
DOI:10.1007/978-981-32-9767-8