VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Sengupta, Anirban (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Dasgupta, Sudeb (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Singh, Virendra (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Sharma, Rohit (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Kumar Vishvakarma, Santosh (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2019.
• Έκδοση: 1st ed. 2019.
• Σειρά: Communications in Computer and Information Science, 1066
• Θέματα: Computer hardware.; Computer organization.; Artificial intelligence.; Computer security.; Optical data processing.; Mathematical logic.; Computer Hardware.; Computer Systems Organization and Communication Networks.; Artificial Intelligence.; Systems and Data Security.; Image Processing and Computer Vision.; Mathematical Logic and Formal Languages.

 This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation. 

 Analog and Mixed Signal Design -- Computing Architecture and Security -- Hardware Design and Optimization -- Low Power VLSI and Memory Design. -Device Modelling -- Hardware Implementation.