VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Sengupta, Anirban (Editor, http://id.loc.gov/vocabulary/relators/edt), Dasgupta, Sudeb (Editor, http://id.loc.gov/vocabulary/relators/edt), Singh, Virendra (Editor, http://id.loc.gov/vocabulary/relators/edt), Sharma, Rohit (Editor, http://id.loc.gov/vocabulary/relators/edt), Kumar Vishvakarma, Santosh (Editor, http://id.loc.gov/vocabulary/relators/edt)
• Format: Electronic eBook
• Language: English
• Published: Singapore : Springer Singapore : Imprint: Springer, 2019.
• Edition: 1st ed. 2019.
• Series: Communications in Computer and Information Science, 1066
• Subjects: Computer hardware.; Computer organization.; Artificial intelligence.; Computer security.; Optical data processing.; Mathematical logic.; Computer Hardware.; Computer Systems Organization and Communication Networks.; Artificial Intelligence.; Systems and Data Security.; Image Processing and Computer Vision.; Mathematical Logic and Formal Languages.

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mix...