Metrology
| Μορφή: | journal |
|---|---|
| Γλώσσα: | English |
| Έκδοση: |
MDPI AG
2022
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| Θέματα: | |
| Διαθέσιμο Online: | https://doaj.org/toc/2673-8244 |
| id |
oai:doaj.org-journal:830d02637eb74817921a4c91bd0ea65e |
|---|---|
| record_format |
dspace |
| spelling |
oai:doaj.org-journal:830d02637eb74817921a4c91bd0ea65e2023-10-20T12:44:52ZMetrology2673-8244https://doaj.org/toc/2673-8244ENCC BYMDPI AGhttps://www.mdpi.com/apchttps://www.mdpi.com/journal/metrologyhttps://www.mdpi.com/journal/metrology/instructionshttps://www.mdpi.com/journal/metrology/abouthttps://www.mdpi.com/journal/metrology/about#copyright2022-11-16T13:55:16Zjournalcyberphysical systemsmachine learning for metrologymetrology for sustainable manufacturingmeasurement uncertainty in dynamic processesElectronic computers. Computer scienceQA75.5-76.95Applied mathematics. Quantitative methodsT57-57.97 |
| institution |
DOAJ |
| collection |
DSpace |
| language |
English |
| topic |
cyberphysical systems machine learning for metrology metrology for sustainable manufacturing measurement uncertainty in dynamic processes Electronic computers. Computer science QA75.5-76.95 Applied mathematics. Quantitative methods T57-57.97 |
| spellingShingle |
cyberphysical systems machine learning for metrology metrology for sustainable manufacturing measurement uncertainty in dynamic processes Electronic computers. Computer science QA75.5-76.95 Applied mathematics. Quantitative methods T57-57.97 Metrology |
| format |
journal |
| title |
Metrology |
| title_short |
Metrology |
| title_full |
Metrology |
| title_fullStr |
Metrology |
| title_full_unstemmed |
Metrology |
| title_sort |
metrology |
| publisher |
MDPI AG |
| publishDate |
2022 |
| url |
https://doaj.org/toc/2673-8244 |
| _version_ |
1801185047049404416 |
