2021_Book_DependableEmbeddedSystems.pdf

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates...

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Γλώσσα:English
Έκδοση: Springer Nature 2020
Διαθέσιμο Online:https://www.springer.com/9783030520175
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spelling oapen-20.500.12657-432792020-12-15T01:50:18Z Dependable Embedded Systems Henkel, Jörg Dutt, Nikil Henkel, Jörg Dutt, Nikil Circuits and Systems Cyber-physical systems, IoT Processor Architectures Electronic Circuits and Systems Cyber-Physical Systems Fault-Tolerant Computing Reliability Enhancers in Embedded Systems SoCs based on cross-layer-reliability System-Level Reliability Analysis Dependable Software Execution Open access Electronics: circuits & components Electrical engineering Cybernetics & systems theory Computer architecture & logic design bic Book Industry Communication::T Technology, engineering, agriculture::TJ Electronics & communications engineering::TJF Electronics engineering::TJFC Circuits & components bic Book Industry Communication::T Technology, engineering, agriculture::TH Energy technology & engineering::THR Electrical engineering bic Book Industry Communication::U Computing & information technology::UY Computer science::UYF Computer architecture & logic design This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems. 2020-12-14T08:27:22Z 2020-12-14T08:27:22Z 2021 book ONIX_20201214_9783030520175_17 https://library.oapen.org/handle/20.500.12657/43279 eng Embedded Systems application/pdf n/a 2021_Book_DependableEmbeddedSystems.pdf https://www.springer.com/9783030520175 Springer Nature Springer International Publishing 10.1007/978-3-030-52017-5 10.1007/978-3-030-52017-5 6c6992af-b843-4f46-859c-f6e9998e40d5 Springer International Publishing 608 open access
institution OAPEN
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language English
description This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.
title 2021_Book_DependableEmbeddedSystems.pdf
spellingShingle 2021_Book_DependableEmbeddedSystems.pdf
title_short 2021_Book_DependableEmbeddedSystems.pdf
title_full 2021_Book_DependableEmbeddedSystems.pdf
title_fullStr 2021_Book_DependableEmbeddedSystems.pdf
title_full_unstemmed 2021_Book_DependableEmbeddedSystems.pdf
title_sort 2021_book_dependableembeddedsystems.pdf
publisher Springer Nature
publishDate 2020
url https://www.springer.com/9783030520175
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