9783731510789.pdf

This work describes the novel use of broadband continuous diplexers that could be integrated into on-wafer probes to parallize millimeter wave on-wafer measurement equipment. A model-based method for the efficient design of diplexers with a large number of adjustable parameters allows the realizatio...

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Λεπτομέρειες βιβλιογραφικής εγγραφής
Γλώσσα:ger
Έκδοση: KIT Scientific Publishing 2021
Διαθέσιμο Online:https://doi.org/10.5445/KSP/1000128278
Περιγραφή
Περίληψη:This work describes the novel use of broadband continuous diplexers that could be integrated into on-wafer probes to parallize millimeter wave on-wafer measurement equipment. A model-based method for the efficient design of diplexers with a large number of adjustable parameters allows the realization of a DC – 110 GHz – 170 GHz diplexer for the first time.