9783731510789.pdf
This work describes the novel use of broadband continuous diplexers that could be integrated into on-wafer probes to parallize millimeter wave on-wafer measurement equipment. A model-based method for the efficient design of diplexers with a large number of adjustable parameters allows the realizatio...
| Language: | ger |
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| Published: |
KIT Scientific Publishing
2021
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| Online Access: | https://doi.org/10.5445/KSP/1000128278 |
