Advances in imaging and electron physics . Volume 163 /

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Άλλοι συγγραφείς: Hawkes, P. W.
Μορφή: Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Amsterdam ; Boston : Elsevier, 2010.
Σειρά:Advances in imaging and electron physics, v. 163
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Περιγραφή
Περίληψη:Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians.
Φυσική περιγραφή:1 online resource (xiv, 228, [6] pages of plates) : illustrations (some color).
Βιβλιογραφία:Includes bibliographical references and index.
ISBN:0123813158
9780123813152
9780123813145
012381314X
ISSN:1076-5670;