Advances in imaging and electron physics. Volume 162 /

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Άλλοι συγγραφείς: Hawkes, P. W.
Μορφή: Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Amsterdam : Academic Press, 2010.
Έκδοση:1st ed.
Σειρά:Advances in imaging and electron physics, v. 162
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Περιγραφή
Περίληψη:Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry expert.
Φυσική περιγραφή:1 online resource (xiv, 275 pages, [8] pages of plates) : illustrations (some color).
Βιβλιογραφία:Includes bibliographical references and index.
ISBN:9780123813176
0123813174
9780123813169
0123813166
ISSN:1076-5670;