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03277nam a2200529 4500 |
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ocn694142286 |
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OCoLC |
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20180501121938.0 |
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100917s2010 ne af ob 001 0 eng d |
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|a E7B
|b eng
|e pn
|c E7B
|d OCLCQ
|d N$T
|d EBLCP
|d OCLCQ
|d MHW
|d OCLCQ
|d OPELS
|d OCLCQ
|d DEBSZ
|d OCLCQ
|d OCLCF
|d YDXCP
|d OCLCQ
|d DEBBG
|d GrThAP
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|a 688506854
|a 712992669
|a 904245924
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|a 9780123813176
|q (electronic bk.)
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|a 0123813174
|q (electronic bk.)
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|a 9780123813169
|q (electronic bk.)
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|a 0123813166
|q (electronic bk.)
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|a (OCoLC)694142286
|z (OCoLC)688506854
|z (OCoLC)712992669
|z (OCoLC)904245924
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|a TK7815
|b .A38 2010eb
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|a SCI
|x 022000
|2 bisacsh
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|a SCI
|x 021000
|2 bisacsh
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|a 537.5/6
|2 22
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|a TEFA
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|a Advances in imaging and electron physics.
|n Volume 162 /
|c edited by Peter W. Hawkes.
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250 |
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|a 1st ed.
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|a Amsterdam :
|b Academic Press,
|c 2010.
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300 |
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|a 1 online resource (xiv, 275 pages, [8] pages of plates) :
|b illustrations (some color).
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336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a Advances in imaging and electron physics,
|x 1076-5670;
|v v. 162
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|a Includes bibliographical references and index.
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|a Font Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Preface; Contributors; Future Contributions; Chapter 1: Energy Filtered X-Ray Photoemission Electron Microscopy; Chapter 2: Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy; Chapter 3: New Dimensions for Field Emission: Effects of Structure in the Emitting Surface; Chapter 4: Conductivity Imaging and Generalized Radon Transform: A Review; Chapter 5: Comparison of Color Demosaicing Methods; Contents of Volumes 151-161; Index; Color Plates.
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520 |
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|a Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry expert.
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|a Print version record.
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650 |
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|a Electronics.
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|a Image processing.
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|a Electrons.
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|a SCIENCE
|x Physics
|x Electromagnetism.
|2 bisacsh
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650 |
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|a SCIENCE
|x Physics
|x Electricity.
|2 bisacsh
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650 |
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|a Electronics.
|2 fast
|0 (OCoLC)fst00907538
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650 |
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|a Electrons.
|2 fast
|0 (OCoLC)fst00907642
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650 |
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|a Image processing.
|2 fast
|0 (OCoLC)fst00967501
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655 |
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|a Electronic books.
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700 |
1 |
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|a Hawkes, P. W.
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776 |
0 |
8 |
|i Print version:
|t Advances in imaging and electron physics. Volume 162, Optics of charged particle analyzers.
|d London : Academic, 2010
|z 9780123813169
|w (OCoLC)620092415
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856 |
4 |
0 |
|u https://www.sciencedirect.com/science/bookseries/10765670/162
|z Full Text via HEAL-Link
|