Advances in imaging and electron physics. Vol. 165 /
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...
Άλλοι συγγραφείς: | Hawkes, Peter W. |
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Μορφή: | Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
San Diego, CA :
Academic Press,
©2011.
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Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Παρόμοια τεκμήρια
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Optics of charged particle analyzers /
Έκδοση: (2011) -
Neutron and X-Ray microscopy.
Έκδοση: (2012) -
Advances in imaging and electron physics.
Έκδοση: (2010) -
Advances in imaging and electron physics.
Έκδοση: (2013) -
Advances in imaging and electron physics.
Έκδοση: (2013)