Structural dynamics of electronic and photonic systems /

"The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro- and opto-electronic structural elements (printed circuit boards, solder joints, heavy devices, etc.) and how to design a viable and reliable...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: Wiley InterScience (Online service)
Άλλοι συγγραφείς: Suhir, Ephraim, Yu, T. X. (Tongxi), 1941-, Connally, Eric
Μορφή: Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Hoboken, N.J. : Wiley, 2010.
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Πίνακας περιεχομένων:
  • Frontmatter
  • Some Major Structural Dynamics-Related Failure Modes and Mechanisms in Micro- and Opto-Electronic Systems and Dynamic Stability of These Systems / David S Steinberg
  • Linear Response to Shocks and Vibrations / Ephraim Suhir
  • Linear and Nonlinear Vibrations Caused by Periodic Impulses / Ephraim Suhir
  • Random Vibrations of Structural Elements in Electronic and Photonic Systems / Ephraim Suhir
  • Natural Frequencies and Failure Mechanisms of Electronic and Photonic Structures Subjected to Sinusoidal or Random Vibrations / David S Steinberg
  • Drop/Impact of Typical Portable Electronic Devices: Experimentation and Modeling / T X Yu, C Y Zhou
  • Shock Test Methods and Test Standards for Portable Electronic Devices / C Y Zhou, T X Yu, S W Ricky Lee, Ephraim Suhir
  • Dynamic Response of Solder Joint Interconnections to Vibration and Shock / David S Steinberg
  • Test Equipment, Test Methods, Test Fixtures, and Test Sensors for Evaluating Electronic Equipment / David S Steinberg
  • Correlation between Package-Level High-Speed Solder Ball Shear/Pull and Board-Level Mechanical Drop Tests with Brittle Fracture Failure Mode, Strength, and Energy / Fubin Song, S W Ricky Lee, Keith Newman, Bob Sykes, Stephen Clark
  • Dynamic Mechanical Properties and Microstructural Studies of Lead-Free Solders in Electronic Packaging / V B C Tan, K C Ong, C T Lim, J E Field
  • Fatigue Damage Evaluation for Microelectronic Components Subjected to Vibration / T E Wong
  • Vibration Considerations for Sensitive Research and Production Facilities / E E Ungar, H Amick, J A Zapfe
  • Applications of Finite Element Analysis: Attributes and Challenges / Metin Ozen
  • Shock Simulation of Drop Test of Hard Disk Drives / D W Shu, B J Shi, J Luo
  • Shock Protection of Portable Electronic Devices Using a ₃Cushion₄ of an Array of Wires (AOW) / Ephraim Suhir
  • Board-Level Reliability of Lead-Free Solder under Mechanical Shock and Vibration Loads / Toni T Matilla, Pekka Marjamaki, Jorma Kivilahti
  • Dynamic Response of PCB Structures to Shock Loading in Reliability Tests / Milena Vujosevic, Ephraim Suhir
  • Linear Response of Single-Degree-of-Freedom System to Impact Load: Could Shock Tests Adequately Mimic Drop Test Conditions? / Ephraim Suhir
  • Shock Isolation of Micromachined Device for High- Applications / Sang-Hee Yoon, Jin-Eep Roh, Ki Lyug Kim
  • Reliability Assessment of Microelectronics Packages Using Dynamic Testing Methods / X Q Shi, G Y Li, Q J Yang
  • Thermal Cycle and Vibration/Drop Reliability of Area Array Package Assemblies / Reza Ghaffarian
  • Could an Impact Load of Finite Duration Be Substituted with an Instantaneous Impulse? / Ephraim Suhir, Luciano Arruda
  • Index.