Surface and thin film analysis : a compendium of principles, instrumentation, and applications /

• Συγγραφή απο Οργανισμό/Αρχή: Wiley InterScience (Online service)
• Άλλοι συγγραφείς: Friedbacher, Gernot, Bubert, H. (Henning)
• Μορφή: Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Weinheim : Wiley-VCH Verlag, [2011]
• Θέματα: Thin films > Surfaces > Analysis.; Electron spectroscopy.; Spectrum analysis.; TECHNOLOGY & ENGINEERING > Nanotechnology & MEMS.; Dünne Schicht; Oberflächenanalyse; Instrumentelle Analytik; Electronic books.

 Electron Detection. X-Ray Photoelectron Spectroscopy (XPS) / Henning Bubert, John C Riviere, Wolfgang S M Werner -- Auger Electron Spectroscopy (AES) / Henning Bubert, John C Rivïre, Wolfgang S M Werner -- Electron Energy-Loss Spectroscopy (EELS) and Energy-Filtering Transmission Electron Microscopy (EFTEM) / Reinhard Schneider -- Low-Energy Electron Diffraction (LEED) / Georg Held -- Other Electron-Detecting Techniques / John C Rivïre -- Ion Detection. Static Secondary Ion Mass Spectrometry (SSIMS) / Heinrich F Arlinghaus -- Dynamic Secondary Ion Mass Spectrometry (SIMS) / Herbert Hutter -- Electron-Impact (EI) Secondary Neutral Mass Spectrometry (SNMS) / Michael Kopnarski, Holger Jenett -- Laser Secondary Neutral Mass Spectrometry (Laser-SNMS) / Heinrich F Arlinghaus -- Rutherford Backscattering Spectroscopy (RBS) / Leopold Palmetshofer -- Low-Energy Ion Scattering (LEIS) / Peter Bauer -- Elastic Recoil Detection Analysis (ERDA) / Oswald Benka -- Nuclear Reaction Analysis (NRA) / Oswald Benka -- Field Ion Microscopy (FIM) and Atom Probe (AP) / Yuri Suchorski, Wolfgang Drachsel -- Other Ion-Detecting Techniques / John C Riviere -- Photon Detection. Total-Reflection X-Ray Fluorescence (TXRF) Analysis / Laszlo Fabry, Siegfried Pahlke, Burkhard Beckhoff -- Energy-Dispersive X-Ray Spectroscopy (EDXS) / Reinhard Schneider -- Grazing Incidence X-Ray Methods for Near-Surface Structural Studies / P Neil Gibson -- Glow Discharge Optical Emission Spectroscopy (GD-OES) / Volker Hoffmann, Alfred Quentmeier -- Surface Analysis by Laser Ablation / Roland Hergenroder, Michail Bolshov -- Ion Beam Spectrochemical Analysis (IBSCA) / Volker Rupertus -- Reflection Absorption IR Spectroscopy (RAIRS) / Karsten Hinrichs -- Surface Raman Spectroscopy / Wieland Hill, Bernhard Lendl -- UV-VIS-IR Ellipsometry (ELL) / Bernd Gruska, Karsten Hinrichs -- Sum Frequency Generation (SFG) Spectroscopy / Gunther Rupprechter, Athula Bandara -- Other Photon-Detecting Techniques / John C Riviere -- Scanning Probe Microscopy. Introduction / Gernot Friedbacher -- Atomic Force Microscopy (AFM) / Gernot Friedbacher -- Scanning Tunneling Microscopy (STM) / Gernot Friedbacher -- Scanning Near-Field Optical Microscopy (SNOM) / Marc Richter, Volker Deckert -- Appendices. Appendix A: Summary and Comparison of Techniques -- Appendix B: Surface and Thin-Film Analytical Equipment Suppliers.