Surface and thin film analysis : a compendium of principles, instrumentation, and applications /

Surface and thin film analysis : a compendium of principles, instrumentation, and applications /

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: Wiley InterScience (Online service)
Άλλοι συγγραφείς: Friedbacher, Gernot, Bubert, H. (Henning)
Μορφή: Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Weinheim : Wiley-VCH Verlag, [2011]
Θέματα:
Thin films > Surfaces > Analysis.
Electron spectroscopy.
Spectrum analysis.
TECHNOLOGY & ENGINEERING > Nanotechnology & MEMS.
Dünne Schicht
Oberflächenanalyse
Instrumentelle Analytik
Electronic books.
Διαθέσιμο Online:Full Text via HEAL-Link
Πίνακας περιεχομένων:
  • Electron Detection. X-Ray Photoelectron Spectroscopy (XPS) / Henning Bubert, John C Riviere, Wolfgang S M Werner
  • Auger Electron Spectroscopy (AES) / Henning Bubert, John C Rivïre, Wolfgang S M Werner
  • Electron Energy-Loss Spectroscopy (EELS) and Energy-Filtering Transmission Electron Microscopy (EFTEM) / Reinhard Schneider
  • Low-Energy Electron Diffraction (LEED) / Georg Held
  • Other Electron-Detecting Techniques / John C Rivïre
  • Ion Detection. Static Secondary Ion Mass Spectrometry (SSIMS) / Heinrich F Arlinghaus
  • Dynamic Secondary Ion Mass Spectrometry (SIMS) / Herbert Hutter
  • Electron-Impact (EI) Secondary Neutral Mass Spectrometry (SNMS) / Michael Kopnarski, Holger Jenett
  • Laser Secondary Neutral Mass Spectrometry (Laser-SNMS) / Heinrich F Arlinghaus
  • Rutherford Backscattering Spectroscopy (RBS) / Leopold Palmetshofer
  • Low-Energy Ion Scattering (LEIS) / Peter Bauer
  • Elastic Recoil Detection Analysis (ERDA) / Oswald Benka
  • Nuclear Reaction Analysis (NRA) / Oswald Benka
  • Field Ion Microscopy (FIM) and Atom Probe (AP) / Yuri Suchorski, Wolfgang Drachsel
  • Other Ion-Detecting Techniques / John C Riviere
  • Photon Detection. Total-Reflection X-Ray Fluorescence (TXRF) Analysis / Laszlo Fabry, Siegfried Pahlke, Burkhard Beckhoff
  • Energy-Dispersive X-Ray Spectroscopy (EDXS) / Reinhard Schneider
  • Grazing Incidence X-Ray Methods for Near-Surface Structural Studies / P Neil Gibson
  • Glow Discharge Optical Emission Spectroscopy (GD-OES) / Volker Hoffmann, Alfred Quentmeier
  • Surface Analysis by Laser Ablation / Roland Hergenroder, Michail Bolshov
  • Ion Beam Spectrochemical Analysis (IBSCA) / Volker Rupertus
  • Reflection Absorption IR Spectroscopy (RAIRS) / Karsten Hinrichs
  • Surface Raman Spectroscopy / Wieland Hill, Bernhard Lendl
  • UV-VIS-IR Ellipsometry (ELL) / Bernd Gruska, Karsten Hinrichs
  • Sum Frequency Generation (SFG) Spectroscopy / Gunther Rupprechter, Athula Bandara
  • Other Photon-Detecting Techniques / John C Riviere
  • Scanning Probe Microscopy. Introduction / Gernot Friedbacher
  • Atomic Force Microscopy (AFM) / Gernot Friedbacher
  • Scanning Tunneling Microscopy (STM) / Gernot Friedbacher
  • Scanning Near-Field Optical Microscopy (SNOM) / Marc Richter, Volker Deckert
  • Appendices. Appendix A: Summary and Comparison of Techniques
  • Appendix B: Surface and Thin-Film Analytical Equipment Suppliers.

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