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03299nam a2200721 4500 |
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ocn729724639 |
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OCoLC |
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20170124072352.4 |
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m o d |
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110609s2011 enka ob 001 0 eng d |
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|z 2010046383
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|a DG1
|b eng
|e pn
|c DG1
|d YDXCP
|d DEBSZ
|d OUP
|d E7B
|d OCLCQ
|d N$T
|d COO
|d B24X7
|d OCLCQ
|d DEBBG
|d AZK
|d LOA
|d GrThAP
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|a 727106405
|a 961514922
|a 962581778
|a 966220950
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|a 9781119990093
|q (electronic bk.)
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|a 1119990092
|q (electronic bk.)
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|a 9781119990109
|q (electronic bk.)
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|a 1119990106
|q (electronic bk.)
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|a 9781119990000
|q (E-Pub)
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|a 1119990009
|q (E-Pub)
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|z 0470748249
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|z 9780470748244
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8 |
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|a 9786613405203
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|b 000047226124
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|a DEBSZ
|b 347954286
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|a DKDLA
|b 820120-katalog:000556387
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|a HEBIS
|b 299832791
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|a DEBBG
|b BV043393155
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035 |
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|a (OCoLC)729724639
|z (OCoLC)727106405
|z (OCoLC)961514922
|z (OCoLC)962581778
|z (OCoLC)966220950
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037 |
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|a 10.1002/9781119990093
|b Wiley InterScience
|n http://www3.interscience.wiley.com
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050 |
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4 |
|a TK7870.23
|b .B395 2011
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072 |
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7 |
|a TEC
|x 008060
|2 bisacsh
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072 |
|
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|a TEC
|x 008070
|2 bisacsh
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082 |
0 |
4 |
|a 621.381
|2 22
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|a TEC032000
|2 bisacsh
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|a MAIN
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100 |
1 |
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|a Bâzu, M. I.
|q (Marius I.),
|d 1948-
|
245 |
1 |
0 |
|a Failure analysis :
|b a practical guide for manufacturers of electronic components and systems /
|c Marius I. Bâzu, Titu-Marius I. Bâjenescu.
|
264 |
|
1 |
|a Chichester, West Sussex, U.K. :
|b Wiley,
|c 2011.
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300 |
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|a 1 online resource (xxii, 317 pages) :
|b illustrations.
|
336 |
|
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|a text
|b txt
|2 rdacontent
|
337 |
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|a computer
|b c
|2 rdamedia
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338 |
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|a online resource
|b cr
|2 rdacarrier
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380 |
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|a Bibliography
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490 |
1 |
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|a Wiley series in quality & reliability engineering
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505 |
0 |
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|a Front Matter -- Introduction -- Failure Analysis ₆ Why? -- Failure Analysis ₆ When? -- Failure Analysis ₆ How? -- Failure Analysis ₆ What? -- Case Studies -- Conclusions -- Acronyms -- Glossary -- Index.
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504 |
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|a Includes bibliographical references and index.
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520 |
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|a "Manufacturers of electronic components, devices, ICs and electronic systems, also reliability testing engineers and managers in this area"--
|c Provided by publisher.
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650 |
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0 |
|a Electronic apparatus and appliances
|x Reliability.
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650 |
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0 |
|a Electronic systems
|x Testing.
|
650 |
|
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|a System failures (Engineering)
|x Prevention.
|
650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Quality Control.
|2 bisacsh
|
650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Digital.
|2 bisacsh
|
650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Microelectronics.
|2 bisacsh
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655 |
|
4 |
|a Electronic books.
|
655 |
|
7 |
|a Electronic books.
|2 local
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700 |
1 |
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|a Băjenescu, Titu I.,
|d 1938-
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776 |
0 |
8 |
|i Print version:
|a Bâzu, M.I. (Marius I.), 1948-
|t Failure analysis.
|d Chichester, West Sussex, U.K. : Wiley, 2011
|z 9780470748244
|w (DLC) 2010046383
|w (OCoLC)690090059
|
830 |
|
0 |
|a Wiley series in quality and reliability engineering.
|
856 |
4 |
0 |
|u https://doi.org/10.1002/9781119990093
|z Full Text via HEAL-Link
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994 |
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|a 92
|b DG1
|