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04786nam a2200565 4500 |
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ocn739118526 |
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20170124071101.9 |
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110706s2011 gw a ob 001 0 eng d |
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|a DG1
|b eng
|e pn
|c DG1
|d CDX
|d E7B
|d OCLCQ
|d EUN
|d GZM
|d DEBSZ
|d OCLCQ
|d YDXCP
|d N$T
|d OCLCO
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|d OCLCQ
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|a 745970610
|a 747412455
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|a 9783527638529
|q (electronic bk.)
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|a 3527638520
|q (electronic bk.)
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|a 9783527638543
|q (electronic bk.)
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|a 3527638547
|q (electronic bk.)
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|z 9783527410248
|q (hbk. ;
|q acid-free paper)
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|z 3527410244
|q (hbk. ;
|q acid-free paper)
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|a 9786613173652
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|a AU@
|b 000047774162
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|a DEBSZ
|b 372695973
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|a NZ1
|b 14146247
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|a NZ1
|b 15340673
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|a DEBBG
|b BV043393303
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|a (OCoLC)739118526
|z (OCoLC)745970610
|z (OCoLC)747412455
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|a 10.1002/9783527638529
|b Wiley InterScience
|n http://www3.interscience.wiley.com
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|a TA418.5
|b .A38 2011
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|a TEC
|x 021000
|2 bisacsh
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|a 620.1/1
|2 23
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|a MAIN
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|a Advanced calculations for defects in materials :
|b electronic structure methods /
|c edited by Audrius Alkauskas [and others].
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|a Weinheim :
|b Wiley-VCH,
|c [2011]
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|c ©2011
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|a 1 online resource (xviii, 384 pages) :
|b illustrations
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a Advances in Electronic Structure Methods for Defects and Impurities in Solids / Chris G Van de Walle, Anderson Janotti -- Accuracy of Quantum Monte Carlo Methods for Point Defects in Solids / William D Parker, John W Wilkins, Richard G Hennig -- Electronic Properties of Interfaces and Defects from Many-Body Perturbation Theory: Recent Developments and Applications / Matteo Giantomassi, Martin Stankovski, Riad Shaltaf, Myrta Gruning, Fabien Bruneval, Patrick Rinke, Gian-marco Rignanese -- Accelerating GW Calculations with Optimal Polarizability Basis / Paolo Umari, Xiaofeng Qian, Nicola Marzari, Geoffrey Stenuit, Luigi Giacomazzi, Stefano Baroni -- Calculation of Semiconductor Band Structures and Defects by the Screened Exchange Density Functional / S J Clark, John Robertson -- Accurate Treatment of Solids with the HSE Screened Hybrid / Thomas M Henderson, Joachim Paier, Gustavo E Scuseria -- Defect Levels Through Hybrid Density Functionals: Insights and Applications / Audrius Alkauskas, Peter Broqvist, Alfredo Pasquarello -- Accurate Gap Levels and Their Role in the Reliability of Other Calculated Defect Properties / Peter Deak, Adam Gali, B̀lint Aradi, Thomas Frauenheim -- LDA + U and Hybrid Functional Calculations for Defects in ZnO, SnO₂, and TiO₂ / Anderson Janotti, Chris G Van de Walle -- Critical Evaluation of the LDA + U Approach for Band Gap Corrections in Point Defect Calculations: The Oxygen Vacancy in ZnO Case Study / Adisak Boonchun, Walter R L Lambrecht -- Predicting Polaronic Defect States by Means of Generalized Koopmans Density Functional Calculations / Stephan Lany -- SiO₂ in Density Functional Theory and Beyond / L Martin-Samos, G Bussi, A Ruini, E Molinari, M J Caldas -- Overcoming Bipolar Doping Difficulty in Wide Gap Semiconductors / Su-Huai Wei, Yanfa Yan -- Electrostatic Interactions between Charged Defects in Supercells / Christoph Freysoldt, Jorg Neugebauer, Chris G Van de Walle -- Formation Energies of Point Defects at Finite Temperatures / Blazej Grabowski, Tilmann Hickel, Jorg Neugebauer -- Accurate Kohn-Sham DFT With the Speed of Tight Binding: Current Techniques and Future Directions in Materials Modelling / Patrick R Briddon, Mark J Rayson -- Green's Function Calculation of Hyperfine Interactions for Shallow Defects in Semiconductors / Uwe Gerstmann -- Time-Dependent Density Functional Study on the Excitation Spectrum of Point Defects in Semiconductors / Adam Gali -- Which Electronic Structure Method for The Study of Defects: A Commentary / Walter R L Lambrecht.
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|a Includes bibliographical references and index.
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|a Print version record.
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|a Materials
|x Defects
|x Mathematics.
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|a Materials
|x Testing
|x Mathematical models.
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|a Semiconductors
|x Materials
|x Testing.
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|a TECHNOLOGY & ENGINEERING
|x Material Science.
|2 bisacsh
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|a Electronic books.
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|a Alkauskas, Audrius.
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|i Print version:
|t Advanced calculations for defects in materials.
|d Weinheim : Wiley-VCH, ©2011
|z 3527410244
|w (DLC) 2012359010
|w (OCoLC)682895142
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856 |
4 |
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|u https://doi.org/10.1002/9783527638529
|z Full Text via HEAL-Link
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|a 92
|b DG1
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