Aberration-corrected analytical transmission electron microscopy /

"The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας: Brydson, Rik (Επιμελητής έκδοσης)
Μορφή: Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Chichester, West Sussex : RMS-Wiley, 2011.
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Περιγραφή
Περίληψη:"The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"--
"The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"--
Περιγραφή τεκμηρίου:"Published in association with the Royal Microscopical Society."
Φυσική περιγραφή:1 online resource (xv, 280 pages, 8 unnumbered pages of color plates) : illustrations (some color)
Βιβλιογραφία:Includes bibliographical references and index.
ISBN:9781119978855
1119978858
9781119978848
111997884X
9781119979906
1119979900
9781119979913
1119979919
DOI:10.1002/9781119978848